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1. Reliability-Based Design Optimization, Philippe Pougnet and Hichame Maanane.
2. Non-Destructive Characterization by Spectroscopic Ellipsometry of Interfaces in Mechatronic Devices, Pierre Richard Dahoo, Malika Khettab, Jorge Linares and Philippe Pougnet.
3. Method of Characterizing the Electromagnetic Environment in Hyperfrequency Circuits Encapsulated within Metallic Cavities, Samh Khemiri, Abhishek Ramanujan, Moncef Kadi and Zouheir Riah.
4. Metrology of Static and Dynamic Displacements and Deformations Using Full-Field Techniques, Ioana Nistea and Dan Borza.
5. Characterization of Switching Transistors under Electrical Overvoltage Stresses, Patrick Martin, Ludovic Lacheze, Alain KamdeL and Philippe Descamps.
6. Reliability OF Radio Frequency Power Transistors to Electromagnetic and Thermal Stress, Samh Khemiri and Moncef Kadi.
7. Internal Temperature Measurement of Electronic Components, Eric Joubert, Olivier Latry, Pascal Dherbecourt, Maxime Fontaine, Christian Gautier, Hubert Polaert and Philippe Eudeline.
8. Reliability Prediction of Embedded Electronic Systems: the FIDES Guide, Philippe Pougnet, Franck Bayle, Hichame Maanane and Pierre Richard Dahoo.
9. Study of the Dynamic Contact Between Deformable Solids, Bouchaïb Radi and Abdelkhalak El Hami.

Abdelkhalak El Hami

Professeur des universités à l’INSA de Rouen Normandie, Abdelkhalak El Hami est spécialiste des problèmes d’optimisation, de fiabilité et d’IA des systèmes multiphysiques.

Philippe Pougnet

Philippe Pougnet est un expert en fiabilité et en technologie-produit-processus. Il est ingénieur-docteur de l’Université scientifique et médicale de Grenoble et ingénieur de l’INPG.