
Sorry, this entry is only available in French.
1. Highly Accelerated Testing, Philippe Pougnet, Pierre Richard Dahoo and Jean-Loup Alvarez.
2. Aging Power Transistors in Operational Conditions, Pascal Dherbecourt, Olivier Latry, Karine Dehais-Mourgues, Jean-Baptiste Fonder, Cédric Duperrier, Farid Temcamani, Hichame Maanane and Jean-Pierre Sipma.
3. Physical Defects Analysis of Mechatronic Systems, Christian Gautier, Eric Pieraerts and Olivier Latry.
4. Impact of Voids in Interconnection Materials, Pierre Richard Dahoo, Malika Khettab, Christian Chong, Armelle Girard and Philippe Pougnet.
5. Electro-Thermo-Mechanical Modeling, Abderahman Makhloufi, Younes Aoues and Abdelkhalak El Hami.
6.Meta-Model Development, Bouzid Ait-Amir, Philippe Pougnet and Abdelkhalak El Hami.
7. Optimizing Reliability of Electronic Systems, Younes Aoues, Abderahman Makhloufi and Abdelkhalak El Hami.
8. High-Efficiency Architecture for Power Amplifiers, Farid Temcamani, Jean-Baptiste Fonder, Cédric Duperrier and Olivier Latry.